Skip the sound room: How to keep noise/vibration testing on the line
John Perkins discusses how an ICP-based accelerometer that’s connected to a test monitoring system can keep noise, vibration and harshness (NVH) testing on the factory floor and avoid the cost and complexity of having to use an anechoic chamber.
Driving quality, traceability for medical device batch manufacturing
In process testing and digital waveform analysis isn’t only for discrete manufacturing where each part is serialized. Ron Pawulski explores how it can also be used to improve yield and quality control in pharmaceutical and medical device batch manufacturing.
NVH Testing Part 2: Ensuring smooth cruising for wheelchair drive motors
John Perkins recaps a use case for noise, vibration and harshness (NVH) testing. A multi-channel sigPOD platform with a strategically located accelerometer helped a wheelchair manufacturer catch problems with motors and gearboxes during production to avoid warranty claims.
NVH Testing Part 1: Transmission woes traced to nicked gears
John Perkins cites a use case for noise, vibration and harshness (NVH) testing. Digital process signature analysis using an accelerometer is put to the test against the traditional microphone approach to catch nicked gears in automotive transmissions on the line during production.
Integrators Part 2: Adapt to a changing market and avoid the ‘Nedry Effect’
Remember that Jurassic Park character, Nedry, who built an IT system no one else could manage? Joe Ventimiglio discusses how machine builders can avoid this mess by not trying to scratch-build a data-driven quality assurance system for a customer.
Integrators Part I: Reduce your risk, be on time and budget
Machine builders are always struggling to stay on budget, on schedule and on spec with their manufacturer customers. Joe Ventimiglio discusses how incorporating the data-driven quality management of Industry 4.0 into their builds can save them a lot of grief.
5 ways a digital process signature can save time and money in manufacturing
We give a primer on how comprehensive data collection from across the plant floor, coupled with digital process signature analysis, can achieve the sometimes contradictory goals of reduced production costs and improved quality.
Overall yield vs. first time yield (FTY): Which offers the greatest return?
Does it make more sense to improve the overall yield of a line, or work to reduce scrap and rework rates to boost first-time yield? We crunch some numbers and illustrate the difference that digital process signature analysis can make.
The Repair Bay, Part 1: What is defect data management and why should I use it?
Patrick Chabot argues why repair bay operations must be viewed as much more than a reactive function, with technicians waiting to address individual problems as they arise. Industry 4.0 demands a more proactive and holistic approach.
Can your leak tester self-diagnose?
Leak testing is a quality assurance process notorious for reliability and repeatability challenges. Steve White discusses how and why Sciemetric includes a self-test function as part of its 3520 Leak Test System, to quickly diagnose any issues that may compromise reliability.